Vertically stacked, field programmable, nonvolatile memory and method of fabrication

ABSTRACT

A three-dimensional, field-programmable, non-volatile memory includes multiple layers of first and second crossing conductors. Pillars are self-aligned at the intersection of adjacent first and second crossing conductors, and each pillar includes at least an anti-fuse layer. The pillars form memory cells with the adjacent conductors, and each memory cell includes first and second diode components separated by the anti-fuse layer. The diode components form a diode only after the anti-fuse layer is disrupted.

This application is a continuation of Johnson et al., U.S. patentapplication Ser. No. 10/313,763, filed Dec. 6, 2002, which is acontinuation of Johnson, U.S. Pat. No. 6,689,644, which is a divisionalof Johnson, U.S. Pat. No. 6,525,953, all of which are herebyincorporated by reference.

BACKGROUND

3D memories can be much lower cost than conventional 2D memories. If aconventional memory occupies A square millimeters of silicon area, thena 3D memory comprising N planes of bits occupies approximately (A/N)square millimeters of silicon area. Reduced area means that morefinished memory devices can be built on a single wafer, thereby reducingcost. Thus there is a strong incentive to pursue 3D memories having manyplanes of memory cells.

Johnson U.S. Pat. No. 6,034,882, assigned to the assignee of the presentinvention and hereby incorporated by reference in its entirety,describes a 3-dimensional, field-programmable, non-volatile memory thatis well suited to extremely small memory cells. Each memory cellincludes a self-aligning pillar of layers formed at the intersectionbetween upper and lower conductors. In one embodiment, each memory cellincludes a steering element such as a diode that is connected in serieswith a state change element such as an anti-fuse layer. Each pillar isisolated from neighboring pillars by a pair of self-aligned etch stepsand subsequent dielectric depositions. When the anti-fuse layer isintact (the cell is not programmed), the cell is electrically an opencircuit. When the anti-fuse layer is breached (the cell is programmed),the cell is electrically a diode in series with the resistance of thebreached anti-fuse layer. Unfortunately, the area and perimeter of thisdiode are the full area and full perimeter of the pillar, and so thisdiode's leakage is relatively high.

Knall U.S. patent application Ser. No. ______ discloses a memory cellwith low leakage. The disclosed memory cell places an anti-fuse layerbetween the anode and the cathode of the diode. When the anti-fuse layeris intact, the cell is electrically an open circuit. But when theanti-fuse is breached, the anode material and cathode material arebought together in a small-diameter filament, and a diode is formed. Thesmall filament gives the so-formed diode a very small area and a verysmall perimeter. Thus the diode's leakage is relatively low. This isadvantageous in the construction of a memory, since diode leakage makessensing (for read operations) difficult, and since diode leakage currentincreases power consumption.

Knall's embodiments use a “rail stack” configuration, in which the anodematerial and the cathode material are continuous stripes extending inorthogonal directions. These embodiments are fabricated with thefollowing steps: deposit the rail stack materials, etch them intostripes, dielectric fill between them, and polish back to expose the topof the rail stack. Then the thin anti-fuse dielectric is deposited orgrown. As will be appreciated by those skilled in the art, it is moredifficult to form a high-quality, thin dielectric film if that film isto be created on a polished surface. The polish operation(conventionally carried out using a CMP, Chemical Mechanical Polish,process) creates defects and leaves particles of slurry behind. Thismakes it harder to create a high quality film.

A need presently exists for an improved memory that is characterized bysmall cell size, ease of manufacture, and low leakage.

SUMMARY

By way of general introduction, the preferred embodiments describedbelow include an array of pillars that are self-aligned at theintersection of first and second crossing conductors. The pillars formmemory cells with the adjacent conductors, and each memory cell includesfirst and second diode components separated by an anti-fuse layer. Thediode components form a diode only after the anti-fuse layer isdisrupted.

This section has been provided by way of general introduction, and it isnot intended to narrow the scope of the following claims.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a perspective view of one embodiment of a memory cell built inaccordance with the present invention.

FIG. 2 is a schematic of an array using the cell of FIG. 1.

FIG. 3 is a cross-sectional elevation view of an array using the cell ofFIG. 1.

FIGS. 4-9 are schematic views of six alternative pillar arrangementsthat can be used in the embodiment of FIG. 1.

FIG. 10(a) is a perspective view of a conductor layer and layer stackused in the fabrication of the cell of FIG. 1.

FIG. 10(b) illustrates the structure of FIG. 10(a) after patterning.

FIG. 10(c) illustrates the structure of FIG. 10(b) after an additionalconductor layer and layer stack have been formed.

FIG. 10(d) illustrates the structure of FIG. 10(c) after patterning.

FIG. 10(e) illustrates the structure of FIG. 10(d) after an additionalconductor layer and layer stack have been formed.

FIG. 10(f) illustrates the structure of FIG. 10(e) after anotherpatterning step.

FIG. 11 is a cross-sectional elevation view of an array using the cellof FIG. 1 where the cells are staggered in the vertical direction.

FIG. 12 is a perspective view of vertically stacked cells.

FIG. 13 is a schematic of the cells of FIG. 12.

FIG. 14 is a plan view of a substrate showing a layout of circuitry inthe substrate.

FIG. 15 is a plan view of a substrate showing another layout ofcircuitry in the substrate.

FIG. 16 is a plan view of a substrate showing one layout of circuitry ina substrate used for the present invention.

FIG. 17 is a plan view of circuitry for an embodiment of the presentinvention using a plurality of subarrays.

DETAILED DESCRIPTION OF THE DRAWINGS

Field-programmable, non-volatile memory cells and memory arrays aredisclosed. In the following description numerous specific details areset forth in order to provide a thorough understanding of theillustrated embodiments. However, it will be apparent to one skilled inthe art that the present invention may be practiced without thesespecific details. In other instances, well-known circuits and processeshave not been described in detail in order not to obscure thedescription. The drawings are not drawn to scale.

OVERVIEW

The field-programmable, non-volatile memory cell described below isbuilt above, rather than in, a planar substrate. Therefore, this memorycell can be stacked vertically in numerous layers to form athree-dimensional array. Each layer of memory cells interacts only withthe layer above and the layer below, which makes vertical stacking oflayers quite simple.

A unique organization of these cells in a three-dimensional memory arraydisposed above a substrate, with peripheral circuitry built in thesubstrate, is also described.

FIG. 1 shows one embodiment of our memory cell. It has two explicitterminals: an input terminal 10 and an output terminal 11. Between theseterminals, the memory cell contains a pillar 12 of layers. Neither theinput terminal 10, nor the output terminal 11, nor the pillar 12 oflayers is built in the planar substrate.

The pillar 12 of layers includes first and second diode components 13,14 separated by an anti-fuse layer 16. The anti-fuse layer 16 isinitially insulating, and in this state no diode is formed. When theanti-fuse layer 16 is disrupted, at least part of the diode component 13contacts the diode component 14, thereby forming a diode.

Once formed, the diode is a device with a strongly asymmetriccurrent-versus-voltage characteristic: it conducts current more readilyin one direction than in the other. The purpose of the diode is toensure that current flow through the memory cell is substantiallyunidirectional. This unidirectional behavior enables the memory decodersto establish a unique circuit path to each individual memory cell,allowing it to be individually accessed (for reads and for writes)regardless of the state of all other cells.

The anti-fuse layer 16 can be placed in more than one state, and itsstate is not lost or altered when electrical power is removed. Onepossible implementation, among the many discussed below, is adielectric-rupture anti-fuse having the states {high impedance} and {lowimpedance}. These two stored states accomplish the encoding of one bitof memory.

As shown in FIG. 1, the pillar 12 has a generally rectangularcross-section. The pillar is vertical and so is the current flow.Depending on the orientation of the diode, current can flow eitherupwards or downwards after the anti-fuse layer 16 is breached. In fact,in one embodiment, current flows upwards in some layers of a verticalstack of cells, and downwards in the other layers.

The anti-fuse layer 16 is chosen so that it can be switched from itsinitial state to another state by electrical means, thereby making thememory field programmable. For example, the state of adielectric-rupture anti-fuse may be changed electrically by applying arelatively large voltage (when compared to the voltage used for reading)across the input and output terminals of the memory cell.

The memory cell of FIG. 1 can be fabricated with full self-alignment inboth the X (east-west) and Y (north-south) directions. This means thepillars are defined by, and are automatically formed by, theintersection of an input conductor and an output conductor. Thus thecell can be made quite small, since its feature sizes need not includeoften-used allowances for misalignment tolerances.

Furthermore, the number of photolithographic masking steps needed tobuild the cell of FIG. 1 is small. For a single level of cells as shownin FIGS. 1 and 2, three masking steps are needed: one to pattern thebottom conductor and cell material, another to pattern the upperconductor and cell material, and a third to provide contact holesoutside the array for vertical electrical connections. This patterningscheme results in a self-alignment of the cell pillar 12 to the upperand lower conductors. If a second level of cells is added verticallyabove the first level, only two additional photolithographic steps areneeded: one for the next level conductor and the cell material, and thesecond for the contacts outside the array. The top conductor of thelower level of cells forms the bottom conductor of the top layer ofcells. In general, if the array contains (N) levels of cells, there are(N+1) conductor layers and (N+1) photomasking steps in the fabricationof the cell array itself. There are also a number of additionalphotomasking steps to form contacts. These contacts are outside the cellarray; they make connection between the array conductor layers and theperipheral circuits.

The memory cell may also be fabricated using alternative embodiments;the self-aligned pillar formation described above may be replaced by aformation involving the use of a pillar formation photomask. Thiseliminates the self-alignment of the pillar to the conductors, but isadvantageous in fabrication processes that potentially exploit thephysics of free sidewalls. These processes include diode componentformation using solid-phase crystallization of amorphous silicon, lasercrystallization of amorphous or polycrystalline silicon, and otherprocesses apparent to persons skilled in the art. The contact to theupper conductor layer in both the self-aligned fabrication process andthe non-self-aligned fabrication process described above is exposed bythe planarization of the insulation, requiring no photomask step. Thisprocess may be replaced by a contact formation photomasking step, aswould be apparent to persons skilled in the art.

Assume the first conductor 25 of FIG. 3 runs east-to-west. Then thesecond conductor 26 will run north-to-south (orthogonally), and memorycell pillars 27 will be formed wherever a vertical projection of thefirst conductor intersects the second conductor. The third-conductor 29will run east-to-west, and memory cell pillars 30 will be formedwherever the third conductor 29 intersects the second conductor 26.Similarly, the fourth, sixth, eighth, tenth, . . . conductors will runnorth-south, and the fifth, seventh, ninth, eleventh, . . . conductorswill run east-west. Odd-numbered conductors run in one direction, andeven-numbered conductors run in the perpendicular direction. Thus,conductor number J forms pillars downward (to wiring layer number J−1)and it forms pillars upward (to wiring layer number J+1).

Since the memory cells need not contact a substrate, a substrate beneaththe memory cell array is available for use other than for defining thememory cells. In one embodiment of the present invention, this area maybe used to good advantage by laying out substantial portions of the rowdecoders, column decoders, I/O multiplexers, and read/write circuitsdirectly beneath the memory cell array. This helps to minimize thefraction of the die surface area not devoted to memory cells, whichincreases the figure of merit known as “array efficiency”:${{Array}\quad{Efficiency}} = \frac{\left( {{Total}\quad{area}\quad{devoted}\quad{to}\quad{memcells}} \right)}{\begin{matrix}{\left( {{Total}\quad{area}\quad{devoted}\quad{to}\quad{memcells}} \right) +} \\\left( {{Total}\quad{area}\quad{devoted}\quad{to}\quad{non}\quad{memcells}} \right)\end{matrix}}$

As can be seen, a decrease in (total area devoted to non-memcells)results in an increased array efficiency.

Memory Cell: Pillar

In the embodiment of the memory cell shown in FIG. 1, there are twoexplicit local terminals: an input terminal 10 (also called a wordline),and an output terminal 11 (also called a bitline). In addition the cellmay also contain “implicit” or “widely shared” terminals which areunavoidable consequences of its construction, and which are common tolarge groups of cells at once. One example of an implicit terminal isthe substrate, which forms a parasitic capacitance to each memory cell.To simplify the figures and the discussion, these implicit terminals areomitted, but as will be appreciated these implicit terminals mightaffect the functionality and performance of the memory cell. Thus thememory cell of FIG. 1 is referred to as a “two terminal structure”,meaning there are two explicit, local, terminals, possibly withadditional terminals that are implicit rather than explicit.

Between its input terminal and output terminal, the memory cell includesa series connection of diode components and an anti-fuse layer. Onceformed, the diode is a semiconductor element that has a stronglyasymmetric current-versus-voltage characteristic; it conducts currentmuch more readily in one direction than in the other. Some possibleimplementations of the diode are (i) a PN junction diode, in amorphous,microcrystalline, polycrystalline or single-crystal semiconductor (e.g.Si, Ge, SiGe, GaAs, InP, etc.); (ii) a metal-semiconductor Schottkydiode; (iii) a junction field-effect transistor with gate connected tosource (or to drain); (iv) a MOSFET with gate either floating, orconnected to source or connected to drain; (v) a Zener diode, avalanchediode, or tunnel diode; (vi) a four-layer diode (SCR); (vii) a P-I-Ndiode in amorphous, microcrystalline, polycrystalline or single-crystalsemiconductor; and others that will be readily apparent to those skilledin the art.

For descriptive purposes in this disclosure the two ends of the diodeare referred to as “anode” and “cathode”, arranged so that conventionalcurrent flows more readily from “anode” to “cathode” than from “cathode”to “anode”. These labels are consistent with standard terminology for aPN junction diode: conventional current in a PN junction diode flowsfrom anode to cathode. Of course the present invention is not limited tothe use of a PN junction diode (as was discussed in the precedingparagraph); the adoption of the same terminal labeling as a diode ismerely for convenience and familiarity. Further, if the voltage on thediode's anode is larger than the voltage on its cathode, the diode is“forward biased.” But when the cathode voltage exceeds the anodevoltage, we will say the diode is “reverse biased.”These phrases aretaken from standard diode terminology, again for convenience andfamiliarity.

The diode can be oriented two different ways: (1) with its anode facingthe input terminal and its cathode facing the output terminal; (2) withits cathode facing the input terminal and its anode facing the outputterminal. Either orientation can be made to function correctly, byappropriate design of the memory decoders and readwrite circuits, andneither orientation is strongly preferred over the other.

Some possible realizations of the anti-fuse layer 16 include, but arenot limited to, (a) dielectric-rupture anti-fuses; (b) intrinsic orlightly-doped polycrystalline semiconductor anti-fuses; (c) amorphoussemiconductor anti-fuses; and others.

During integrated circuit manufacturing, the anti-fuse layer 16 of thememory cell is fabricated and placed in a certain one of its possiblestates; this is called the “initial state.” For example, if theanti-fuse layer is a dielectric-rupture anti-fuse having the two states(ruptured dielectric) and (intact dielectric), the initial state of thiselement is (intact) after manufacturing and before programming. Otherembodiments of anti-fuse layers will have different sets of states andthus different initial states. By convention this initial state, the“logic zero” state, denotes the initial value stored in the memory cellduring semiconductor manufacturing. Of course, other conventions, e.g.calling the initial state “logic one,” would be equally valid, and thechoice is merely a matter of preference or convenience rather thantechnological necessity.

The memory cell is programmed by causing the anti-fuse layer 16 totransition from its initial state into a new state. Many embodiments ofthe anti-fuse layer 16 can be caused to change state by applying asuitably large voltage across the memory cell, from input terminal tooutput terminal.

For example if the anti-fuse layer 16 is embodied as adielectric-rupture anti-fuse, it is programmed by applying a largevoltage across the cell's terminals (or by forcing a large currentthrough the cell), with the polarity chosen such that the diode isforward biased. This places a large electric field directly across thedielectric anti-fuse, which ruptures the dielectric, thus changing thestate of the anti-fuse layer.

One possible method for programming a dielectric-rupture anti-fuse layeris to ground the memory cell's output terminal and simultaneously raiseits input terminal to a large positive voltage (assuming the diode is sooriented that its anode faces the input terminal and its cathode facesthe output terminal, i.e., diode is forward biased when the inputterminal is at a higher voltage than the output terminal). If the diodeis oriented the other way, with anode facing the output terminal andcathode facing the input terminal, the designer can simply reverse theprogramming voltages and keep the diode forward biased duringprogramming: ground the input terminal and simultaneously raise theoutput terminal to a large positive voltage. Many other voltagearrangements for forward biasing the diode and programming adielectric-rupture anti-fuse layer will be readily apparent to thoseskilled in the art.

Other embodiments of the anti-fuse layer can be caused to change stateby forcing a suitably large current through the memory cell, rather thanby forcing a large voltage across the memory cell. For example, if theanti-fuse layer is embodied as a polysilicon-resistor fuse, it may beprogrammed by connecting a current source to its input terminal andsimultaneously grounding its output terminal (assuming this polarityforward biases the diode). Assuming the current is large enough, italters the resistance of the polysilicon-resistor fuse, thus changingthe state of the anti-fuse layer and programming the cell.

During programming, it is possible for nonselected memory cells to bereverse-biased by the full programming voltage. Accidental writes ofnonselected memory cells may occur, if the reverse leakage current ofthe diode exceeded the programming current necessary to change the stateof the anti-fuse layer. Thus, the characteristics of the diode andanti-fuse layer should be matched to one another: an anti-fuse layerthat requires a large current to program (e.g., an instrinsic poly fuse)can be used with a rather high-leakage diode, while an anti-fuse layerthat programs at very low current (e.g., a dielectric rupture anti-fuse)is preferably combined with a low-leakage diode.

In a first embodiment, if a thin, highly resistive, polycrystallinesilicon film anti-fuse is employed (as taught in U.S. Pat. No.4,146,902), its programming operation is irreversible and the cell isone-time programmable. After manufacturing and before programming, allcells contain “logic zero”. Those cells whose desired contents are“logic one” are programmed, irreversibly, by forcing the anti-fuse intoa new state. Logic zeroes may become logic ones (by programming), butlogic ones may not become logic zeroes (since programming isirreversible in this type of device).

While the above discussion is based on an anti-fuse layer that has twostates, this is not necessary. An anti-fuse that can provide apredetermined range of resistance where for instance it is partly fused,and the anti-fuse would then provide a three-state element.

Memory Cell: Conductors

As shown in FIG. 1, the field-programmable, non-volatile memory cellconsists of a vertical pillar, with a conductor at the bottom of thepillar and another conductor at the top.

The bottom conductor is a relatively long conductor line or wire on afirst conductor layer. This conductor runs in a certain direction (forexample, east-to-west). The top conductor is a relatively long conductorline or wire on a second conductor layer, vertically above the layerthat forms the bottom conductors. The top conductors run in anotherdirection (for example, north-to-south). The angle between the top andbottom conductors is preferably ninety degrees (i.e. it is preferredthey are orthogonal), but this is not mandatory. The memory cell pillaris located at the intersection where the top conductor crosses over aprojection of the bottom conductor.

In practice the conductors on each level are parallel, spaced-apartconductors. For example, the space between each conductor can be equalto the conductor's width.

The first conductor layer (“conductors1”) contains a large number ofparallel conductors all running in the same direction, for example,east-to-west. And the second conductor layer (“conductors2”) alsocontains a large number of parallel conductors all running in the samedirection, for example, north-to-south, preferably perpendicular to theconductor direction of the first conductor layer as shown in FIG. 3.Wherever a conductor on conductors2 crosses over (or “intersects”) aconductor on conductors1, one of our field programmable non-volatilememory cells is fabricated. This is shown in FIG. 2.

Vertically from bottom to top, the memory cell of FIGS. 1-3 contains aconductor, then a pillar, then another conductor:conductors1→pillar→conductors2. Conductors1 is on the bottom andconductors2 is on the top. But then conductors2 is the bottom of a newlevel of memory cells, vertically stacked above the first level:conductors1→pillar1→conductors2→pillar2→conductors3. The array of FIGS.1-3 stacks multiple levels of memory cells above one another: a verticalstack having (N) levels of memory cells contains (N) levels of pillarsand (N+1) layers of conductors. (It takes (N+1) conductor layers to make(N) levels of cells: one conductor on the bottom of each level ofpillars, and then one more conductor on the top of the array). FIG. 3shows a portion of a three-dimensional memory array according to thepresent invention, having N=6 levels of memory pillars and (N+1)=7conductor layers. A vertical stack of (N) pillars uses 1/N as muchsurface area as an assembly of (N) pillars that are not stackedvertically; vertical stacking gives an N-fold improvement in density.

A memory pillar's bottom conductor is the top conductor of the memorypillar below, and a memory pillar's top conductor is the bottomconductor of the memory pillar above. This makes stacking especiallysimple and flexible.

In one embodiment, the two conductors at either end of a memory pillarare perpendicular. And since conductors are shared between levels ofpillars, the result in this embodiment is that even-numbered conductorsrun in one direction, and odd-numbered conductors run in theperpendicular direction. For example, suppose conductors1 runseast-to-west. Conductors2 would be perpendicular to conductors1, soconductors2 would run north-to-south. Conductors3 would be perpendicularto conductors2, so conductors3 would run east-to-west. Conductors4 wouldrun north-to-south (perpendicular to conductors3), and so forth. Thusconductors 1, 3, 5, . . . run east-to-west, and conductors 2, 4, 6, . .. run north-to-south (in this example).

Fabrication

In one embodiment of the present invention, a conductor layer (say,conductor layer number J) runs north-to-south, and adjacent conductorlayers (numbers J−1 and J+1) run east-to-west. Wherever a conductor'svertical projection on layer (J) crosses over a conductor on layer(J−1), a memory cell pillar is created. Similarly, wherever aconductor's projection on layer (J+1) crosses a conductor on layer (J),a memory cell pillar is created. Memory cell pillars are defined andpatterned by the intersection (crossover) of the conductors, and so thepillars are self-aligned to the conductors. Self-alignment is anextremely important advantage, because it lets the photolithographicpatterns of the memory cell be designed without including any extraallowance for misalignment tolerances. Thus the pattern features of ourself-aligned memory cell may be made smaller, resulting in a smallercell area, which gives higher density and lower cost.

For purposes of illustrating the self-aligned fabrication of thesepillars, consider an embodiment which uses four sequential layers ofmaterial (a “layer stack”) to fabricate the diode components and theanti-fuse layer. In this illustrative example the diode components makeup a polycrystalline silicon PN junction diode, and the anti-fuse layerconsists of a poly-oxide-poly dielectric rupture anti-fuse. Otherembodiments are set forth in the body of this application.

The pillars described above can take many forms, and FIGS. 4-9 providesix illustrative examples. In each case, the pillars are shown betweencrossing upper and lower conductors.

In the example of FIG. 4, a memory array is fabricated on a substrate100 that may be a conventional silicon monocrystalline substrate.Alternately, the substrate 100 may be a Silicon-on-Sapphire substrate, aDielectrically Isolated substrate, or a Silicon-on-Insulator substrate.As an initial step an insulating layer 102 is formed over the substrate100. This layer 102 may be planarized with for instance chemicalmechanical polishing (CMP) to provide a flat surface on which the arraycan be fabricated.

Following this, a conductive layer 114 is formed on the insulating layer102. Many materials are suitable for fabricating conductive layers,including elemental metals such as tungsten, tantalum, aluminum, copperand metal alloys such as MoW. Metal silicides may also be used such asTiSi₂ or CoSi₂, or a conductive compound such as TiN, WC may be used. Ahighly doped semiconductor layer such as silicon is also suitable.Multiple layer structures may be used selecting one or more of theabove.

Following the deposition of a conductive layer, a layer 115 ofsemiconductor material such as silicon is formed over the conductivelayer. This is typically a polysilicon layer; however, an amorphouslayer may be used. Other semiconductor materials may be used such as Ge,GaAs, etc. In the embodiment of FIG. 4 this semiconductor layer is ahighly-doped diode component, and forms one-half of a diode.

Following this, in the embodiment of FIG. 4, a material for theanti-fuses used to program the array is deposited (shown as layer 120).In one embodiment, the layer 120 is a dielectric such as silicon dioxidethat is deposited by chemical vapor deposition (CVD). Growth of theanti-fuse can be achieved by a number of methods, including hot steamoxidation, dry thermal oxidation, plasma-oxidation, wet-chemicaloxidation and electrochemical oxidation. Materials that can be used forthe anti-fuse layer, and that can be grown and/or deposited, include;silicon dioxide, silicon nitride, silicon oxynitride, amorphous carbonand other insulating materials or combinations of materials. (Also anundoped layer of silicon may be used for the anti-fuse layer.)

Two additional layers are then formed: a lightly-doped silicon layer 121doped with a conductivity type dopant opposite to that used for thesilicon layer 115, and a heavily-doped silicon layer 122 doped alsoopposite to the layer 115. After masking and etching, the layers 114,115, 120, 121, 122 are configured as parallel strips, self-aligned withthe edges of the conductive layer 114.

The spaces between adjacent strips are then filed with a dielectric suchas silicon dioxide, and then planarized by CMP. In another embodiment,spin-on-glass (SOG) is used to fill the voids between adjacent strips.In this case, chemical planarization can be used, such as plasmaetching, for example. Other fill and planarization methods can be used.

Next, another conductive layer 123 is deposited, followed by a heavilydoped silicon layer 124 doped with the same conductivity type dopant aslayers 121 and 122. Next another anti-fuse layer 125 is formed, forinstance from a dielectric such as silicon dioxide. The anti-fuse layer125 is then covered with a silicon layer 126 doped with aconductivity-type dopant opposite that of layer 124. This is alightly-doped layer. Another silicon layer 127 is formed on layer 126,and this layer is doped with the same conductivity type dopant as layer126; however, layer 127 is more heavily doped than is layer 126. Afterpatterning steps, another conductive layer 128 is formed above the layer127. In this example, the layers 115-122 form a pillar between thecrossed conductors 114,123, and the layers 124-127 form a pillar betweenthe crossed conductors 123,128.

Masking and etching steps as described below in conjunction with FIGS.10(a)-10(f) can be used. The memory cell of FIG. 4 is well suited forused with a relatively high write voltage such as 5-20 volts. When thisrelatively high voltage causes a breach in the anti-fuse layer 120 or125, a diode is created between the adjacent diode components 115,121;124,126. Without this high voltage, the anti-fuse layer 120,125 remainsan insulator. Thus, by selecting a pair of conductors, diodes can beselectively formed to program the memory array. It is currentlypreferred that the write voltage be applied with a polarity such thatthe more positive voltage is applied to the conductor adjacent the anodeof the diode that is created once the anti-fuse layer is breached. It isalso possible to program using a reverse-bias potential.

To sense the data programmed into the array, a voltage lower than thewrite voltage is used. This voltage is applied to forward bias the cellbeing read, thus allowing a sense amplifier to determine whether or notthe anti-fuse layer of the respective cell is intact.

It should be noted that n+layers sandwich the conductor layer 128 andare deposited on the upper side of the conductive layer 114. Thesehighly-doped layers prevent ohmic transitions to prevent unintendedSchottky diode formation. Only a single lightly-doped layer (inconjunction with a heavily doped layer) is needed to define a diode; thethickness of this lightly-doped layer is important in controlling thebreakdown voltage and resistance of the diode so formed.

It should be noted that the p and n-type layers immediately below eachof the conducting layers 123,128 are heavily doped. It is theseheavily-doped layers that are planarized, which simplifies fabrication.

Table 1 provides preferred materials for the example of FIG. 4.Polysilicon semiconductor material can be used for the semiconductorlayers and can be deposited with a CVD process, where a dopant such asphosphorus is deposited along with silicon. Alternatively, the dopantmay be ion implanted following deposition of the layer. TABLE 1Preferred Materials (FIG. 4) Dopant Concentration Ref. No. MaterialThickness (Å) Dopant (atoms/cm⁻³) 115, 125 Si0₂  50-1000 126 Si1000-4000 Phosphorous 1 × 10¹⁷ (1 × 10¹⁵-1 × 10¹⁹) 115 Si  300-3000Phosphorous >10¹⁹ 114, Ti-TiN  500-1500 123, 128 127 Si 1500-2000Phosphorous >10¹⁹

Throughout this specification, two adjacent semiconductor layers areoften shown with different levels of doping (e.g., layers 126,127 orlayers 121, 122). Such pairs of adjacent layers may be formed with onedeposition, using ion implantation steps at two different energy levelsto obtain the two doping levels. Also, these differently-doped layersmay be formed by introducing different amounts of dopant in a diffusionprocess as a layer is formed.

The conductive layers 114, 123,128 may be formed using any of numerouswell-known thin-film deposition processes such as sputtering. Arefractory metal may be used, or a silicide of a refractory metal may beused. Other alternatives include aluminum, copper, or heavily dopedsilicon. In one embodiment, titanium and titanium nitride layers areformed, and the wafer is heated to form a silicide. For example, atitanium layer of 250 Å thickness and a titanium nitride layer of 70 Åthickness can be heated at 600° C. for one minute to form the silicide.After planarization, the layer 127 preferably has a thickness between300 and 2,000 Å.

FIG. 5 shows another possible arrangement, which uses similar layers tothose of FIG. 4 arranged in a different order.

FIG. 6 shows another alternative, in which all p-type semiconductorlayers have been eliminated. In this embodiment the conductive layer 123is sandwiched between two n+ layers, and more lightly doped n− layersare disposed on these more heavily doped n+ layers. An anti-fuse layeris disposed between the n− layer and the adjacent conductive layer114,128.

Programming the array of FIG. 6 causes the formation of Schottky diodes.For this reason, the conductors such as conductive layers 114,123, 128should be made of a suitable material to allow formation of a Schottkydiode. For instance, aluminum and some refractory metal or suicides maybe used.

Some of the embodiments discussed above use both p−n+ and p+n− diodetypes. In some processes, one of these diode types may exhibit moreleakage than the other. Consequently, it may be desirable to have, forthese processes, an array with only a single diode type. Morespecifically, assume a process has higher leakage for diodes of the p−n+type than the same process has for diodes of the p+n− type. FIG. 7illustrates an array embodiment where, if the anti-fuse layer isbreached, all the diodes will be p+n− type, that is, there will be nodiodes with a p−n+ junction. Table 2 provides preferred thicknesses forthe layers 130-138 of FIG. 7. TABLE 2 Preferred Thickness (FIG. 7) Ref.No. Thickness (Å) 114, 123 500 130, 138 1000 131, 136 30 132, 135 2000133, 134 500

As discussed above, the semiconductor layers may be formed usingpolysilicon or an amorphous silicon. The conductors may be a highlydoped silicon or a metal, metal alloy, silicide or combinations thereof.The dielectric fill in the spaces between the pillars is also used, asdiscussed for the earlier embodiments.

As can be seen from FIG. 7, if the anti-fuse layer 131 is breached, thediodes between the conductors 114 and 123 are all p+n− type, andsimilarly, the diodes in the next level between the conductors 123 and128 are again all p+n− type. The pillars shown in FIG. 7 are usedthroughout the memory array, so that the entire array has only p+n− typediodes in its memory cells.

The diodes in the illustrated pillars of FIG. 7 are forward biasedtowards the conductor 123 and the conductor 141. If need be for aparticular application, the diodes can be oriented identically, that is,with all their anodes (or cathodes) pointing upwardly. This can beobtained for the p+n− type diodes by having both a p+ doped and n− dopedsemiconductor layer in each of the pillars. For instance, layer 134 and135 would be replaced with a p+ layer and layer 138 would be replacedwith n−and n+layers. This still maintains only one type of diode (p+n−)throughout the array.

While FIG. 7 shows that after the anti-fuse layer is breached, only p+ndiodes will be created, an array with only p−n+ type diodes can befabricated by replacing the p+ layers with an n+ layer and replacing then+ and n− layers with p+ and p− layers. Also, the array can have theanodes (or cathodes) vertically aligned as discussed above for the p+n−type diodes.

Another memory array embodiment, which uses only a single type of diodejunction, is shown in FIG. 8. This embodiment employs conductors150,152,154, each formed of a respective, uniformly doped semiconductormaterial. As shown in the example of FIG. 8, the conductors 150,154 areformed of p-type semiconductor material, such as a doped layer ofpolysilicon. The conductor 152 is formed of an n-type semiconductormaterial, which again can be formed of doped polysilicon. In thisexample, each pillar is made up of only a single respective anti-fuselayer 156,158,160. Each of the conductors 150,152,154 is both aconductor and a diode component for the respective memory cells. Forexample, when the anti-fuse layer 156 is disrupted, the conductor/diodecomponents 150, 152 come into contact with one another and form a PNdiode. The advantage of the embodiment of FIG. 8 is easy fabrication.

Typically, the semiconductor strips 150,152,154 are less conductive thanthe metal conductors previously discussed. This, for instance, willincrease the access time of the cells, particularly in a large array.The conductivity of the strips 150,152,154 can be improved by increasingthe concentration of the p-type and n-type dopants. However, when thisis done, the leakage current increases. For any given array, decreasedresistance can be traded-off for increased leakage and vice-versa. It iscontemplated that this embodiment will be especially useful for arelatively small array where high-speed access is not critical.

As can be seen from FIG. 8, after the anti-fuse is breached, the diodesassociated with each of the cells are the same; specifically the p- andn-type dopant concentrations for each diode are the same.

In the above description two levels share a conductor. An array may befabricated where there are two conductors for each level that are notshared with other levels. A dielectric may be used to separate each suchlevel. Also while above diodes on alternate levels “point” in the samedirection for some embodiments, this is not necessary. For instance, ashared conductor may have diodes point-in from above and point-out frombelow. This requires different driving circuitry in the substrate.

The example of FIG. 9 is similar to that of FIG. 7. All silicon layersare deposited as amorphous or microcrystalline layers, and the siliconis preferably recrystallized during an annealing step at 800° C. that isperformed after all layers are deposited. The titanium disilicide layersare preferably formed as described in U. S. patent application Ser. No.______ (Attorney Docket No 10519/57), assigned to the assignee of thepresent invention and hereby incorporated by reference in its entirety.As described in this application, a layer of undoped amorphous siliconis formed under a layer of Ti, and the thickness of the amorphoussilicon is 2.4 times greater than that of the Ti. Two successiveannealing operations (the first at 600° C. for 60 seconds and the secondat 800° C. 60 seconds) convert these two layers to low-resitivitytitanium dioxide. Table 3 provides preferred layer parameters. TABLE 3Preferred Materials (FIG. 9) Dopant Reference Thickness ConcentrationNo. Material (Å) Dopant (atoms/cm⁻³) 114, 123, TiSi₂ 500 128 172, 177Si0₂ 25 174, 175 Poly Si 500 Phosphorous >1 × 10²⁰ 173, 176 Poly Si 2000Phosphorous   1 × 10¹⁷ 178 Poly Si 1500 Boron >1 × 10²⁰ 170 Poly Si 2000Boron >3 × 10²⁰

All the above embodiments have benefits over the prior-artthree-dimensional memories. One advantage is that the diodes are formedby breaching an anti-fuse layer. This results in diodes with very smalljunction areas. The resultant low-leakage diodes improve the performanceof the array. The different embodiments provide numerous materialchoices and diode component choices.

Fabrication Sequence

A preferred fabrication sequence for the memory cell is schematicallyillustrated in FIGS. 10(a)-10(f). After deposition and beforepatterning, the conducting layer 46 and layer stack 45 are continuoussheets that extend across the entire integrated circuit (indeed acrossthe entire wafer) such as shown in FIG. 10(a). The layer stack 45 caninclude any of the sets of layers that make up a pillar in the examplesof FIGS. 4-9. Conceptually the self-alignment method is a two-etch-stepprocedure: In the first etch step, this layer stack (a continuous sheet)is patterned into long straight strips running (say) east-to-west, byetching them with the same patterning step that etches the east-to-westconductors on the conductor layer below. After deposition andplanarization of an interlevel dielectric, a second conductor and layerstack are deposited. This stack is patterned into long straight stripsrunning north south. Etching used to pattern the north-to-southconductors continues until the first layer stack has also been etchedthrough. This results in pillars formed on the east-to-west runninglines. The resulting pillars are perfectly aligned to both the conductorbelow and the conductor above since both the pillars and the conductorsare etched simultaneously. In alternate embodiments the semiconductorlayers within the layer stack 45 may be deposited as microcrystalline orpolycrystalline, and then laser treated to improve crystallinity andenhance the dopant activation.

The cross-section of the pillar will be rectangular with one dimensionbeing equal to the width of the bottom conductors and the otherdimension equal to the width of the top conductors. If these conductorshave equal width then the cross-section will be square.

The patterning in both east-to-west and north-to-south uses well-knownphotolithographic steps widely used in the semiconductor industry andmay use either wet or dry etching. Also, the silicon used in the cellsand in some cases for the conductors may be doped insitu or after beingdeposited, for example, by ion implantation.

Of course other patterning technologies may be used rather than etching,for example “liftoff” technology or “Damascene” technology or anadditive rather than subtractive patterning technology may be employedinstead of etching. But ideally the layer stack should be patterned intwo separate steps, once with the mask that defines the conductorsbelow, and again with the mask that defines the conductors above. Thisholds true regardless of the specific fabrication techniques used topattern the various layers.

In practice a large number of vertically stacked memory cells are built,and each conductor layer is self-aligned to both the layer stack belowand the layer stack above. Therefore the etching steps which self-alignthe conductors to the pillars, must etch away material from threedifferent layers: the layer stack above, the conductor layer, and thelayer stack below.

The processing may begin with a wafer that may have received priorprocessing steps, for example, CMOS transistors may be fabricated in thesubstrate for the peripheral circuitry. An insulator then is deposited,and preferably, planarized (using chemical-mechanical polishing (“CMP”),resist etchback planarization, or any of a number of other technologiesfor planarization). The first conductor layer is deposited such as layer46 of FIG. 10(a), and then the first layer stack 45 is deposited. FIG.10(a) shows the wafer at this stage.

Next, the mask that defines the features on the conductors1 layer isapplied, and these features are etched into both the pillar layer stack45 and the conductors1 layer 46 below. An insulator is deposited on thewafer and planarized, using CMP or other planarizing technology. FIG.10(b) shows the wafer at this stage. Note in particular that the pillarlayer stack and bottom layer have been etched into long continuousstrips (46 a and 45 a) and (46 b and 45 b), not isolated individualpillars. Also note that the edges of the pillar layer stack 45 a and 45b are aligned to the edges of the conductor 46 a and 46 b layer, sinceboth were etched at the same time with the same mask. Note theconductors generally comprise coplanar conductors, such as aluminum orother metals, silicides, or doped silicon conductors, for each level.

While not shown in FIG. 10(b) or the other figures, the dielectric fillsthe voids between the strips (and pillars) and thus adds support to thearray. Also it should be noted that the planarization reveals the uppersurface of the strips so that the conductor layer that follows contactsthe strips. The planarized dielectric also forms the layers throughwhich vias and vertical conductors pass.

Next, the second conductor layer 50 (“conductors2”) is deposited, andthe second layer stack 51 (“stack2”) is deposited. FIG. 10(c) shows thewafer at this stage. Note that the planarization automatically gives aself-aligned contact between a layer stack (such as 45 b) and thesubsequent conductor layer (such as 50) above it.

Now, the conductors2 mask is applied, and its features are etcheddownward into three distinct strata: layer stack2 (51), conductors2layer 50, and layer stack1 (45 a and 45 b). (This etch stops below thediode components within 45 a and 45 b, providing a unique circuit paththrough the memory cell). An insulator is deposited on the wafer andplanarized (using CMP or other means). FIG. 10(d) shows the wafer atthis stage. Note that the conductors2 mask+etch has completed thedefinition of the individual pillars (45 a 1, 45 a 2, 45 b 1 and 45 b 2)in the layerstack1. Also note that these pillars in the layerstack1layer are aligned to both the conductors1 layer (46 a, 46 b) and to theconductors2 layer (50 a, 50 b), thereby achieving the goal ofself-alignment.

Next, the third conductor layer 52 (“conductors3”) is deposited, and thethird layer stack 53 (“layerstack3”) is deposited. FIG. 10(e) shows thewafer at this stage.

Now, the conductors3 mask is applied, and its features are etcheddownwards into layerstack3, conductors3, and stack2. (This etch stopsbelow the diode components of layer stack 2 and is intended to leave theconductors layer intact.) An insulator is deposited on the wafer andplanarized (using CMP or other means). FIG. 10(f) shows the wafer atthis stage. The conductors3 mask+etch has completed the definition ofthe individual pillars in the layerstack2 layer (such as 51 a 1, 51 a 2,51 b 2). FIG. 10(f) shows that (N+1)=3 conductor layers and hence(N+1)=3 masking steps, are required to pattern (N=2) layers of pillarlayerstack (not counting the interlevel via layers which are used in theperipheral circuits but not in the memory array). The wafer is now readyto receive more stack layers and conductor layers, at the discretion ofthe manufacturer.

In one possible embodiment of an array of the invented memory cells thepillars are vertically stacked directly above one another as illustratedin FIG. 10(f). Note that pillars are lined up in vertically alignedstacks. However, because of self-alignment, this vertical stacking ofpillars directly above one another is not a requirement.

Memory cell pillars are automatically formed wherever a conductor onconductor layer (J+1) crosses over a conductor on conductor layer (J).This is true even if the conductor layers are not lined up directlyabove one another, giving vertical stacks of pillars. In fact it may bepreferred that the pillars not be stacked vertically; that is they areoffset from one another, as illustrated in FIG. 11. Compare FIG. 3(vertical stacks of pillars) to FIG. 11 (pillars offset from oneanother) to see the effect. Offset or staggered pillar placement such asshown in FIG. 11, may be advantageous in practice. It may help give asmoother wafer surface, more suited to planarization and polishing.

In the foregoing sequence of steps, electrode or conductor material isetched along with device material. Since most plasma metal etches alsoetch polysilicon, a practical combination of materials that enables suchdual etching would be aluminum and polysilicon, for example. Control ofthe etching process may be effected, if desired, through the use of etchchemistries that are selective (e.g., preferentially etchingpolysilicon, but stopping on aluminum), or through the use of barriermaterials that are not etched by the etchants that remove electrode anddevice material. The anti-fuse layer may also be used as an etch stop,particularly if it is an oxide rupture type.

Refractory metals such as molybdenum and tungsten are compatible withconventional CVD deposition temperatures for Si and may be used for theconductors. Metal silicides are compatible with even higher temperaturesused to activate dopants in Si. Even heavily doped Si itself can be usedas a conductor. The choice may be dictated based on resistivity andintegration concerns including etch characteristics.

The planarization described after the first half-step of the foregoingallows the formation of self-aligned contacts to the half-etched cells(i.e., the lines running in the east-west direction in the foregoingexample). Such planarization may be effected through a variety of meanswell known in the art, such as chemical-mechanical polishing (CMP),etched-back spin-on dielectric layers, and etched-back spin-on polymers,to cite three well-known examples. To tolerate the possibility ofexcessive over-polishing or over-etching that may occur duringplanarization, a second planarization may be performed after depositionof an electrode layer to insure a planar electrode surface forsubsequent deposition of device material layers.

The foregoing process sequence exploits self-alignment to reduce therequired alignment tolerances between the pillar and the conductors.This embodiment may be substituted with an embodiment involving one ormore additional photomasking steps to explicitly define the pillaritself, rather than defining it using the intersection of two conductorphotomasking steps, as is done in the self-aligned process. This may beadvantageous in various processes that exploit the explicitly definedsidewalls that result from such a process. For example, solid-phasecrystallization of amorphous silicon can be used to form the diodecomponent layer stack. The free energies of the sidewalls are expectedto favor the formation of a single crystal or grain within the diodecomponent, which may be advantageous in some embodiments.

Another process that can exploit explicitly defined sidewalls islaser-induced crystallization. Again, the free energies of the sidewallsare expected to favor the formation of a single crystal or grain withinthe diode components.

In processes involving the explicit definition of the pillar, aphotomasking step can be used to define a bottom conductor which is thenetched. Then, the layer stack required to form the anti-fuse andoptionally the diode components is deposited. Another photomasking stepis used to define the pillar, which is then etched. After this etch, aninsulating material is deposited and planarized as in the self-alignedcell, exposing the top of the pillar to form a self-aligned contact. Thetop conductor is then deposited, and the process is repeated forsubsequent levels of cells as required.

The order of masking steps in the above process can also be reversed.For example, the pillar can be formed prior to patterning the bottomconductor. In this process, the entire layer stack for the bottomconductor, the diode components, and the anti-fuse layer is deposited.The pillar is then lithographically defined and etched. The bottomconductor is then defined and etched. This structure is passivated usinga planarized insulator-contacting scheme, as described above. In allthree processes, the self-aligned contact can also be replaced by anexplicit contact-forming photomasking step.

The various device fabrication steps may result in the presence ofresidual chemicals or dangling bonds that may degrade devicecharacteristics. In particular, device leakage can result from thepresence of such dangling bonds or chemicals (e.g., incompletely removedphotoresist). A low-temperature (e.g., <400C) plasma oxidation exposuremay be used to grow a clean-up oxide on the edges of the device pillar,thereby passivating edge traps. The growth of the oxide is self-limitingbecause the oxygen species diffuse only slowly through previously grownoxide, resulting in extremely uniform oxide thickness and, therefore,improved manufacturability. (Plasma oxidation may also be used to forman anti-fuse layer.) Oxide deposition may also be used to passivate thesurface, for example, either alone or in conjunction with a grown oxide.

Because, in the foregoing for some embodiments, device material (e.g.,polysilicon) is deposited after electrode material (e.g., metals), it isdesirable to deposit and process the device material at the lowestpractical temperatures to widen the selection of suitable metals. As anexample, in-situ doped polysilicon may be deposited at low temperaturesusing LPCVD (low pressure chemical vapor deposition), PECVD(plasma-enhanced chemical vapor deposition), PVD (physical vapordeposition), or UHVCVD (ultra high vacuum chemical vapor deposition). Analternative is to deposit undoped polysilicon, followed by doping andactivation using a low temperature process. (Traditional activationsteps such as long thermal anneals expose the wafer to potentiallyundesirably high temperatures.) It may also be desirable in some casesto substitute microcrystalline or amorphous silicon or crystallizedamorphous silicon for the polysilicon to enable low temperaturefabrication.

Another concern is the possibility of diffusion of electrode material(e.g., metal) into the device layer during processing. Low-temperatureprocessing helps to reduce the severity of this problem, but may beinsufficient to solve it completely. To prevent this problem, a numberof barrier materials may be employed. Examples include titanium nitride(TiN), tantalum (Ta) or tantalum nitride (TaN), among many that are wellknown to the art.

In one embodiment of the cell, a thin dielectric layer is employed as ananti-fuse element. In such a cell, good uniformity of dielectricthickness, as well as a low film defect density (e.g., of pinholes inthe dielectric) are among highly desirable properties. The quality ofthe dielectric may be enhanced through a variety of means, such asrotating (continuously or periodically) the substrate and/or sourceduring deposition; forming the dielectric by thermal means using plasmasor low-temperature growth chemistries; or by employing liquid-phasedielectric deposition means.

It is desirable to reduce the number of masking steps that involvecritical alignment tolerances. One method for reducing the number ofmasking steps is to employ vias that interconnect several electrodelayers. The vias may be rectangular, rather than square, to allow arelaxation in alignment tolerances. For example, to interconnect metallines in several layers running in the x-direction, the x-edge via sizemay be made substantially looser than the pitch of the x-lines in they-direction, resulting in a rectangular via.

Memory Cell: Small Feature Sizes

As was previously discussed, self-alignment permits the pattern featuresof the memory cell to be small, since it is not necessary to allow formisalignment tolerances when laying out the features. These smallerfeatures allow reduction in the memory cell area, in fact smaller thanit otherwise could be without self-alignment. There is also a secondbenefit of the memory cell area that permits additional reduction of thecell size: the highly repetitive pattern of geometric features on eachmask layer.

The geometric shapes in each layer of the memory cell arrays describedabove are especially simple: they are merely a highly repetitive,regular set of closely spaced, long, straight parallel conductor lines.Their simplicity and regularity can be exploited in photolithography,allowing better resolution of smaller feature sizes than otherwise wouldbe possible with arbitrary-shaped geometries. For example, if a (waferstepper and illumination source and lens and photoresist) system werenormally rated for X micron resolution (e.g. 0.18 microns), the simpleand highly regular shapes of the present invention would permit linesand spaces substantially smaller than X microns. The present inventioncan take advantage of the fact that there are no arbitrary-shapedgeometries; rather there is a highly repetitive, very simple pattern,which is well known in the field of optics and is called a “diffractiongrating” in textbooks. It will be readily apparent to those skilled inthe art how to exploit the advantages of a diffraction grating patternto achieve better resolution.

3 Dimensional Array Organizations

For a moment assume an embodiment that has six layers of memory cellpillars, and that therefore has seven conductor layers of conductors. Ifthe bottom conductor layer (conductors1) runs east-to-west, thenconductors3, conductors5, and conductors7 also run east-to-west.Conductors2, conductors4, and conductors6 run north-to-south. Forsimplicity consider an embodiment in which the pillars are not offset orstaggered; rather, they are stacked directly above one another. A singlevertical stack of six such pillars is shown in FIG. 12.

The stack of six memory cell pillars (60-65) of FIG. 12 is shown as acircuit schematic diagram in FIG. 13. Notice that conductor layers1,3,5,7 are spaced apart from one another in the schematic diagram, butin the physical structure (FIG. 12) they are vertically stacked directlyabove one another. Similarly, conductor layers 2,4,6 are verticallystacked in FIG. 12 but spaced apart in FIG. 13.

There are six memory cell pillars in FIG. 12: one where conductors2crosses conductors1, one where conductors3 crosses conductors2 . . . ,and one where conductors7 crosses conductors6. In the schematic of FIG.13 these are shown along a diagonal. At the bottom left, a memory cell(containing diode components and an anti-fuse layer) is shown betweenconductors2 and conductors1. FIG. 13 also shows a memory cell whereconductors3 crosses conductors2, another cell where conductors4 crossesconductors3, etc.

Adjacent layers of memory cell pillars share a conductor layer; thusthey also share an I/O terminal. In one embodiment, sharing only occursbetween terminals of like type: input terminals share a conductor layerwith other input terminals, and output terminals share a conductor layerwith other output terminals. This embodiment is advantageous, because itmeans each conductor layer is unambiguously either an input layer or anoutput layer. There is no mixing as would occur if a conductor layerwere shared among input terminals and output terminals, and theperipheral circuitry is simplified. Input-terminal-driver circuits andoutput-terminal-receiver circuits need not be collocated and multiplexedonto the same conductor.

A result of the like-terminals-shared preference is that the diodecomponents in the memory cells will be oriented alternately cathode-up,then cathode-down, then cathode-up, etc. To see this, suppose conductorlayer conductors2 is an output layer; then the cathodes of pillar andpillar 61 both connect to conductors2. Thus pillar must be orientedcathode-up and pillar 61 is cathode-down. Continuing, if conductors2 isan output layer, then conductors3 is an input layer. The anodes ofpillar 61 and pillar connect to conductors3. So pillar is cathode-up.The layers of pillars must alternate, cathode-up, cathode-down, up,down, up, and so forth (see FIG. 13) for this embodiment. This meansthat during fabrication, the sublayers of the pillar sandwich will bedeposited in a different order. In some pillar layers the anode materialsublayer will be deposited before the cathode material sublayer, and inthe other pillar layers the cathode material sublayer will be depositedfirst. Thus the layers shown in FIGS. 4-9 will be in the order shown inalternate array levels and in the opposite order in the remaininglevels. However, it should be recalled that it is not necessary toalternate the stack material for some embodiments.

A further result of the preference for sharing like terminals of memorycells is that it makes the conductor layers alternate between inputterminals only and output terminals only. Since successive conductorlayers run east-to-west, then north-to-south, then east-to-west, etc.,this means that all input conductors will run the same direction (e.g.east-to-west), and all output conductors will run the same direction(e.g. north-to-south). So it will be especially easy to locate theinput-terminal-driver circuits together (e.g. along the west edge of thememory array), and to locate the output-terminal-receiver circuitselsewhere (e.g. along the south edge of the memory array).

This corresponds to standard practice in conventional memory design: theinput-terminal-driver circuitry 67 is located along the west edge of thearray, and the output-terminal-receiver circuitry 68 is located alongthe south edge of the array, as shown in FIG. 14. Sometimes conventionalmemories put half the input-terminal-driver circuits along the east edgeand half along the west edge; this is often done when the memory cellrow pitch is very tight. Similarly, conventional memories sometimesplace half the output-terminal-receiver circuits along the south edgeand half along the north edge; this is done when the memory cell columnpitch is very tight. FIG. 15 shows a conventional memory with thissplitting performed.

It is now appropriate to note that the input-terminal-driver circuitryin a non-volatile memory (both conventional prior art, and the presentinvention) has a shorter and less cumbersome name: “row address decoder”circuitry. And the output-terminal-receiver circuitry in a non-volatilememory (both conventional prior art, and the present invention) has ashorter and less cumbersome name: “column address decoder and columnI/O” circuitry. In this section of the disclosure, which discusses arrayorganization outside the memory cell mats, this shorter name will beused.

It is possible to fold the row decoder circuits and the column decoderand column I/O circuits underneath the memory array. (This is possiblebecause the memory array is above the underlying substrate and does notcontact the substrate.) Completely folding all of the row decodercircuits and all of the column circuits underneath the array is notdone; such folding would overlap in the comers. In one embodiment, thecolumn decoder and column I/O circuits are folded beneath the memoryarray, but the row address decoder circuits remain outside the array. Inanother embodiment, the column circuits are underneath the array, andthe central portion of the row decoders is folded (where there is noconflict with the column circuits) under the array. This gives a layoutwith small “tabs” of row circuits at the comers, as shown in FIG. 16.These tabs can be interdigitated with the tabs of other memory arrays,letting four (or more) arrays nestle closely together, as shown in FIG.17. Other variations on the theme of partially folding decoders underthe array will be readily apparent to those skilled in the art.

As the previous paragraph alludes, the field-programmable, non-volatilememory of the present invention includes the organization of the memorychip into several smaller subarrays, rather than one single large array.Subarrays give three important benefits: (1) they allow a simpleblock-level approach to redundancy; (2) they increase operating speed;(3) they lower operating power. Redundancy with subarrays can be quitestraightforward. If the end product is to be a memory having (say) 8Nbits, it is a simple matter to build nine subarrays on the die, eachcontaining N bits. Then one of the nine subarrays can be defective, yetthe die can still be configured and sold as a working 8N bit memory, bysimply bypassing the defective subarray.

Dividing the memory into subarrays also increases speed; this is becausethe conductors are shorter (decreasing their resistance), and there arefewer memory cells attached to each conductor (decreasing thecapacitance). Since delay is proportional to the product of resistanceand capacitance, cutting conductor length in half cuts delay by a factorof four. Thus subarrays decrease delay, i.e. increase speed.

Subarrays also provide lower power operation. Since one importantcomponent of power is the capacitive charging and discharging ofconductors in the memory array, decreasing the conductor capacitancewill decrease power consumption. Cutting conductor length in half cutscapacitance in half, which cuts the capacitive charging and dischargingcurrent in half.

Johnson U.S. Pat. No. 6,034,882 should be referenced for a furtherdiscussion of contact formation, row decoding and selection, columndecoding and selection, pre-charging the memory array, and read/writeperipheral circuits.

As used here, the term “set” is intended to mean one or more. Thus, aset of layers in a pillar can include a single layer as shown in FIG. 8,or two or more layers as shown in FIGS. 4, 5, 6, 7 and 9.

The foregoing detailed description has discussed only a few of the manyforms that this invention can take. This detailed description istherefore intended by way of illustration, and not by way of limitation.It is only the following claims, including all equivalents, which areintended to define the scope of this invention.

1. A process for fabricating a state change element in a semiconductormemory device comprising the steps of: forming a first semiconductorlayer; forming a grown anti-fuse layer overlying and in contact with thefirst semiconductor layer; and forming a second semiconductor layer onand in contact with the anti-fuse layer, wherein said memory devicecomprises first and second diode components separated by the anti-fuselayer, said diode components forming a diode only after the anti-fuselayer is disrupted.
 2. The process of claim 1, wherein the step offorming a grown anti-fuse layer comprises growing silicon dioxide. 3.The process of claim 1, wherein the step of forming a grown anti-fuselayer comprises growing silicon nitride.
 4. The process of claim 1,wherein the step of forming a first semiconductor layer comprisesforming a first layer of polycrystalline silicon doped with aconductivity determining dopant.
 5. The process of claim 1, wherein thestep of forming a first semiconductor layer comprises forming a layer ofamorphous silicon.
 6. The process of claim 1, wherein the step offorming a first semiconductor layer comprises forming a layer ofrecrystallized silicon.
 7. A process for fabricating a memory cellcomprising: forming two diode components; and forming an anti-fuse layerbetween the diode portions, wherein the anti-fuse layer is formed by anoxidation process.
 8. The process of claim 7, wherein the oxidationprocess forms a silicon dioxide layer on a semiconductor material withinone of the diode components.
 9. A process for fabricating a cell in a3-D, field-programmable, non-volatile memory comprising: forming a firstconductor layer; forming a semiconductor layer overlying the conductorlayer; oxidizing at least a portion of the semiconductor layer to forman oxide layer thereon; forming a silicon layer overlying the oxidelayer; sequentially etching the silicon layer, the oxide layer, and thesemiconductor layer to form a pillar of the cell, and forming a secondconductor layer overlying the second semiconductor layer; wherein saidcell comprises first and second diode components separated by the oxidelayer, said diode components forming a diode only after the oxide layeris disrupted.
 10. The process of claim 9, wherein the first conductorlayer comprises a refractory metal.
 11. The process of claim 10, whereinthe refractory metal is tungsten.